March 20, 2020
During 2019 Scienta Omicron developed and released a new electron analyser for ARPES and XPS, the DA20. The new DA20 is designed not only to avoid sample rotation, but is also optimised for the measurement of photoelectrons with low kinetic energies, making it a great product for time resolved ARPES (tr-ARPES).
During 2019 Scienta Omicron developed and released a new electron analyser for ARPES and XPS, the DA20. “Drawing upon the strengths of the DA30-L and its patented ground-breaking deflection technology, the DA20 received a completely new lens design that brings deflection capability to a new family of compact analysers. If you are looking to expand your research group’s capability with ARPES, the DA20 is an excellent choice,” says Scienta Omicron CEO Johan Åman. The new DA20 is designed not only to avoid sample rotation, but is also optimised for the measurement of photoelectrons with low kinetic energies, making it a great product for time resolved ARPES (tr-ARPES).
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